(Hong Kong)
Product Summary
The HEF4023BT is a Triple 3-input NAND gate. The HEF4023BT provides the positive triple 3-input NAND function. The outputs are fully buffered for highest noise immunity and pattern insensitivity of output impedance.
Parametrics
HEF4023BT absolute maximum ratings: (1)Propagation delays In → On HIGH to LOW: 25ns type @ VDD =10V; (2)Propagation delays In → On LOW to HIGH: 30ns type @ VDD =10V; (3) Output transition times HIGH to LOW: 30ns type @ VDD =10V; (4) Output transition times LOW to HIGH: 30ns type @ VDD =10V.
Features
HEF4023BT features: (1)Propagation delays In → On HIGH to LOW: 65ns type @ VDD =5V; (2)Propagation delays In → On LOW to HIGH: 65ns type @ VDD =5V; (3)Output transition times HIGH to LOW: 60ns type @ VDD =5V; (4)Output transition times LOW to HIGH: 60ns type @ VDD =5V.
Diagrams
| Image | Part No | Mfg | Description |  |
Pricing (USD) |
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 HEF4023BT,652 |
NXP Semiconductors |
Gates (AND / NAND / OR / NOR) TRIPLE 3IN NAND GATE |
Data Sheet |
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HEF4023BT,653 |
NXP Semiconductors |
Gates (AND / NAND / OR / NOR) TRIPLE 3-INPUT NAND GATE |
Data Sheet |
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